Using the patented D-Scan and M-Scan optics,
the Metavision i-Series spectrometers deliver
high resolution and low detection limits with
high accuracy and repeatability making them
the go-to solutions to nearly every commercial
requirement in metals industries.

• Wavelength range from 130-670 nm to cover 40+ elements
• Low level analysis for Carbon, Nitrogen and key elements across applications
• Optimised for analysis of high-purity metals and alloys including Aluminium, Copper, Lead,Zinc etc.
• Comprehensive range of diagnostic and safety features