Designed to meet the highest and most
stringent standards of performance, reliability
and repeatability, the Metavision X-Series,
with its innovative multi-optics system,
extended wavelength range and plethora of
analytical features, assures the entire gamut of
analytical features and analyses of the widest
range of elements right down to trace levels.

• Wavelength range from 120-800 nm to cover 50+ elements
• Ultra-low detection limits for Carbon,Nitrogen, Oxygen etc.
• Trace analysis across all key elements in all types of metals and alloys
• Time-resolved spectrometry (TRS),soluble-insoluble analysis