Metavision X-Series
The zenith of sensitivity

Designed to meet the highest and most
stringent standards of performance, reliability
and repeatability, the Metavision X-Series,
with its innovative multi-optics system,
extended wavelength range and plethora of
analytical features, assures the entire gamut of
analytical features and analyses of the widest
range of elements right down to trace levels.

Key Features

• Wavelength range from 120-800 nm to cover 50+ elements
• Ultra-low detection limits for Carbon,Nitrogen, Oxygen etc.
• Trace analysis across all key elements in all types of metals and alloys
• Time-resolved spectrometry (TRS),soluble-insoluble analysis

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